穿透式厚度量測儀
Penetrative Thickness Measurement System
Embedded Files
產品技術介紹
產品技術介紹
Technology Introduction
Technology Introduction
Ker-Lai Interfere Meter
Confocal microscopy
Confocal microscopy
成功應用案例 1 厚度量測
成功應用案例 1 厚度量測
Successful Application 1 – Thickness measurement
Successful Application 1 – Thickness measurement
成功應用案例 2 晶圓量測
成功應用案例 2 晶圓量測
Successful Application 2 – Wafer measurement
Successful Application 2 – Wafer measurement
晶圓翹取量測 Wafer Warpage
晶圓厚度量測 Wafer Thickness
成功應用案例 3 內部缺陷檢測
成功應用案例 3 內部缺陷檢測
Successful Application 3 – Inner Crack Inspection
Successful Application 3 – Inner Crack Inspection
晶片表面無裂痕 Chip Surface no crack
晶片內部裂痕缺陷 Crack inside Chip
缺陷自動顏色標記 Crack Inspection with Color
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